Home - Products - Measurement & Analyzer Instrument - Benchtop X-ray Diffractometer for Material Characterization
The KS-MAI-XD27mini Benchtop X-ray Diffractometer (XRD) is a compact, high-performance X-ray diffraction system designed for rapid and accurate phase identification, crystal structure analysis, and material characterization.
Technical Parameters
Product Description:
The KS-MAI-XD27mini Benchtop X-ray Diffractometer (XRD) is a compact, high-performance X-ray diffraction system designed for rapid and accurate phase identification, crystal structure analysis, and material characterization. Featuring a precision goniometer with a 150 mm radius and an optimized optical geometry, the instrument delivers excellent angular accuracy, repeatability, and measurement stability for both research laboratories and industrial quality control.
Equipped with a high-stability X-ray generator, a metal-ceramic sealed Cu target X-ray tube, and optional proportional or one-dimensional semiconductor detector, the KS-MAI-XD27mini provides outstanding data quality with fast scanning speeds up to 1500°/min. Multiple scanning modes, including continuous, step, and Ω scanning, enable flexible testing for a wide variety of samples, while the compact benchtop design minimizes laboratory space requirements without compromising analytical performance.
The integrated Windows-based software offers comprehensive instrument control, automatic data acquisition, peak searching, background subtraction, profile fitting, quantitative analysis, Rietveld refinement, and XRD simulation. With support for crystallinity analysis, lattice parameter calculation, phase identification, and PDF database matching, the system is suitable for advanced materials research and routine analytical applications alike.
Technical Parameters:
| Item | Specification |
| Model | KS-MAI-XD27mini |
| X-ray Generator Power | 600 W (40 kV, 15 mA) or 1200 W (40 kV, 30 mA) |
| Output Stability | ±0.005% |
| X-ray Tube | Metal ceramic sealed X-ray tube, Cu target |
| Tube Power | 2.4 kW |
| Focal Spot Size | 1 × 10 mm |
| Cooling Method | Air cooling or water cooling (water flow ≥ 2.5 L/min) |
| Goniometer | θs–θd structure, goniometer radius 150 mm |
| Scan Modes | Continuous scan, Step scan, Ω scan |
| Scanning Range | θs/θd linkage: 3°–150° |
| Minimum Step Size | 0.0001° |
| Angle Repeatability | 0.0005° |
| Maximum Angular Speed | 1500°/min |
| Detector | Sealed proportional detector or 1D semiconductor detector |
| Energy Resolution | <25% |
| Maximum Linear Count Rate | ≥5 × 10⁵ CPS (proportional detector); ≥9 × 10⁷ CPS (1D semiconductor detector) |
| Computer | Branded commercial notebook computer |
| Operating System | Windows |
| Control Software | Automatic control of X-ray generator voltage/current, optical path and detector aging calibration, continuous & step scan, data acquisition and instrument control |
| Data Processing Functions | Automatic peak search, manual peak adjustment, integral intensity, peak height, center, background subtraction, smoothing, peak separation, profile fitting |
| Analysis Software | Phase identification, qualitative analysis, Kα1/Kα2 stripping, full-pattern fitting, inverse matching, lattice constant & crystallite size calculation, crystallinity analysis, crystallographic indexing, PDF database, quantitative analysis, Rietveld refinement (WPF), XRD simulation |
| Radiation Protection | Lead glass protective window with interlock; leakage radiation ≤1 μSv/h |
| Instrument Repeatability | ≤1‰ |
| Sample Capacity | Quick-change sample holder, up to 6 samples per loading |
| Overall Dimensions (W × D × H) | 600 × 410 × 670 mm |
| Optical Geometry | Optimized geometric optical path for easy installation of accessories and special sample holders |
| X-ray Tube Advantage | Metal ceramic sealed tube for higher operating efficiency |
| Detector Feature | Sealed proportional detector, durable and maintenance-free |
